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A hybrid scanning force and light microscope for surface imaging and three‐dimensional optical sectioning in differential interference contrast
Author(s) -
STEMMER A.
Publication year - 1995
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1995.tb03577.x
Subject(s) - microscope , differential interference contrast microscopy , optics , optical microscope , microscopy , materials science , interference microscopy , optical sectioning , inverted microscope , resolution (logic) , computer science , scanning electron microscope , physics , artificial intelligence
Summary The design of a scanned‐cantilever‐type force microscope is presented which is fully integrated into an inverted high‐resolution video‐enhanced light microscope. This set‐up allows us to acquire thin optical sections in differential interference contrast (DIC) or polarization while the force microscope is in place. Such a hybrid microscope provides a unique platform to study how cell surface properties determine, or are affected by, the three‐dimensional dynamic organization inside the living cell. The hybrid microscope presented in this paper has proven reliable and versatile for biological applications. It is the only instrument that can image a specimen by force microscopy and high‐power DIC without having either to translate the specimen or to remove the force microscope. Adaptation of the design features could greatly enhance the suitability of other force microscopes for biological work.