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Application of back‐scattered electron imaging to the study of the lichen‐rock interface
Author(s) -
WIERZCHOS J.,
ASCASO C.
Publication year - 1994
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1994.tb04787.x
Subject(s) - lichen , thallus , scanning electron microscope , weathering , materials science , geology , composite material , biology , botany , geomorphology
Summary In the study of the lichen‐rock interface, light microscopy, scanning electron microscopy (SEM) in secondary emission mode and transmission electron microscopy are the most commonly used techniques. As these methods have some limitations, there is a need to explore other techniques for observation of the lichen‐substrate interface. One of the most promising methods is the application of SEM in the back‐scattered electron (BSE) emission mode. The thallus of Aspicilia intermutans (Nyl.) Arn. growing on granitic rock was examined by SEM in BSE mode. The detailed preparation of transverse sections of the lichen‐rock contact zone is presented. The BSE scanning images of the lichen‐rock interface obtained present new insights into the ultrastructural features of the biological components, providing more information about the biogeophysical and biogeochemical weathering of rock.