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A novel method of Z‐contrast imaging in STEM applied to double‐labelling
Author(s) -
TICHELAAR W.,
FERGUSON C.,
OLIVO J.C.,
LEONARD K. R.,
HAIDER M.
Publication year - 1994
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1994.tb04783.x
Subject(s) - scanning transmission electron microscopy , contrast (vision) , labelling , optics , detector , concentric , materials science , transmission electron microscopy , image contrast , physics , chemistry , mathematics , geometry , biochemistry
Summary A novel method of Z ‐contrast imaging in the scanning transmission electron microscope (STEM) is presented. The technique relies on the element dependence of the angular distribution of the scattered electrons, and is realized with a detector consisting of a set of concentric rings. It is possible to discriminate 9‐nm colloidal gold and silver specifically distributed on thin sections. In addition to this practical work, numerical evaluations are used to assess the method. With two smaller markers, this approach will be useful in discriminating closely spaced antigenic sites when steric hindrance occurs with double‐labelling using probes of different sizes.