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Atomic force microscopy in the photochemistry of chalcones
Author(s) -
KAUPP G.
Publication year - 1994
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1994.tb04319.x
Subject(s) - atomic force microscopy , chemical physics , crystal (programming language) , solid state , chemistry , crystal structure , microscopy , lattice (music) , crystallography , materials science , nanotechnology , optics , physics , computer science , acoustics , programming language
Summary The application of atomic force microscopy (AFM) to photodimerization of crystalline chalcones provides new insights into the detailed mechanisms of solid‐state reactions on the molecular level. Well‐directed long‐range transport phenomena are found which reach far beyond the crystal lattice distances. Reactions occur in the surface region where the light is absorbed. Characteristic features are built up that depend on crystal structure and crystal face. This could not be foreseen by previous theories based solely on a topochemical postulate/principle. There is now a much more intimate correlation of crystal structure with solid‐state reactivity and this is directly studied and proven experimentally by AFM. Even solid‐state reactions which are in opposition to topochemistry can be studied and understood on a molecular basis. The three‐dimensional resolution of undisturbed insulating surfaces which is obtained by AFM is not available by any other technique.