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Modelling of inclined and curved surfaces in the reflection scanning acoustic microscope
Author(s) -
WEISE W.,
ZININ P.,
BOSECK S.
Publication year - 1994
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1994.tb03522.x
Subject(s) - scanning acoustic microscope , reflection (computer programming) , optics , planar , microscope , rayleigh scattering , transducer , plane (geometry) , surface (topology) , materials science , rayleigh wave , acoustics , acoustic microscopy , physics , microscopy , geometry , surface wave , mathematics , computer science , programming language , computer graphics (images)
Summary An expression is derived for the output signal when an inclined plane surface is imaged by the reflection scanning acoustic microscope, which is modelled as a spherical transducer. This expression is applied to model non‐planar surfaces. The accuracy of this approach is tested for perfectly reflecting spherical surfaces. The influence of inclination on V (z) curves is considered when Rayleigh waves occur.