Premium
An atomic force microscope for cytological and histological investigations
Author(s) -
MARIANI T.,
MUSIO A.,
FREDIANI C.,
SBRANA I.,
ASCOLI C.
Publication year - 1994
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1994.tb03506.x
Subject(s) - atomic force microscopy , magnetic force microscope , microscope , materials science , nanotechnology , physics , optics , magnetization , quantum mechanics , magnetic field
Summary An atomic force microscope (AFM) specifically designed for cytological and histological studies and able to operate on the same scale of the highest optical magnification is described. The AFM is a non‐invasive instrument; it operates on samples which do not require any kind of treatment and it can produce information that supplements and completes the information given by traditional microscopical methods. The apparatus has been used to image fixed human chromosomes and to investigate the action of trypsin during the staining for banding. First results showed that banding patterns very similar to G‐banding pre‐exist to staining and to trypsin treatment in human metaphase chromosomes, and that the trypsin treatment induces a structural collapse in the chromatin. The instrument was also used on thin sections of plant tissue and gave promising results. Experience confirmed that AFM is a suitable tool for this kind of investigation, and proved the importance of developing AFM microscopes specifically designed for routine use in cytology and histology, conceived for non‐specialized users.