Premium
Fractal characterization by frequency analysis. II. A new method
Author(s) -
AGUILAR M.,
ANGUIANO E.,
PANCORBO M.
Publication year - 1993
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1993.tb03417.x
Subject(s) - fractal dimension , fractal , fractal analysis , characterization (materials science) , fourier transform , fractal dimension on networks , dimension (graph theory) , image (mathematics) , fourier analysis , frequency analysis , replication (statistics) , mathematics , computer science , mathematical analysis , geometry , optics , computer vision , algorithm , physics , statistics , pure mathematics
Summary A new frequency analysis method, fractal analysis by circular average (FACA), and an image replication procedure are proposed that together produce accurate measurements of the fractal dimension of surfaces and profiles, eliminating Fourier transform artefacts which arise from the lack of periodic continuity in real surfaces and profiles.