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Fractal characterization by frequency analysis. I. Surfaces
Author(s) -
ANGUIANO E.,
PANCORBO M.,
AGUILAR M.
Publication year - 1993
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1993.tb03416.x
Subject(s) - fractal , characterization (materials science) , fractal analysis , profilometer , fractal dimension , field (mathematics) , computer science , frequency analysis , optics , algorithm , materials science , mathematics , physics , mathematical analysis , surface finish , pure mathematics , composite material
Summary A study of the quality and accuracy of the methods based on frequency analysis for the fractal characterization of surfaces as measured by scanning tunnelling microscopy (or profilometry) is made. The study is based on computer simulation of images of fractal surfaces. A discussion of the mathematical algorithms used for computer generation of fractal surfaces then follows. The main conclusion is that studies of fractal characterization by frequency analysis reported in previous papers in the STM field, as well as conclusions about the performance of the various methods, are doubtful. New methods for frequency analysis that in some cases produce more reliable results are proposed.