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Depth discrimination in scanned heterodyne microscope systems
Author(s) -
Somekh Michael G.
Publication year - 1992
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1992.tb03257.x
Subject(s) - microscope , optics , heterodyne (poetry) , focus (optics) , phase (matter) , cardinal point , sample (material) , microscopy , optical transfer function , resolution (logic) , 4pi microscope , optical microscope , materials science , computer science , physics , artificial intelligence , acoustics , scanning electron microscope , conventional transmission electron microscope , scanning transmission electron microscopy , quantum mechanics , thermodynamics
SUMMARY The optical transfer function of several scanning microscope systems is derived, using a physically intuitive approach. The technique allows a wide range of systems to be modelled with only minor modifications to the basic formulation. The results are then used to determine the response of various scanning microscopes for objects both in and out of the focal plane. The possibility of performing extended‐focus phase imaging in heterodyne microscopes by scanning the sample along the optical axis is also examined. This mode of operation should allow measurements of minute topographical and phase variations on tilted or warped samples with the same lateral resolution as would be obtained when the sample is in focus throughout the entire scan.