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Quantification procedures for electron energy‐loss spectroscopy and imaging: the use of correspondence analysis for element determination
Author(s) -
Gelsema E. S.,
Beckers A. L. D.,
Sorber C. W. J.,
Bruijn W. C.
Publication year - 1992
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1992.tb01528.x
Subject(s) - formalism (music) , homogeneous , spectroscopy , qualitative analysis , element (criminal law) , electron energy loss spectroscopy , electron , computational physics , materials science , analytical chemistry (journal) , chemistry , biological system , physics , statistical physics , chromatography , nuclear physics , qualitative research , art , musical , social science , quantum mechanics , sociology , political science , law , visual arts , biology
SUMMARY A systematic investigation of the application of correspondence analysis to the determination of element responses in electron spectroscopic imaging is presented. The formalism of correspondence analysis has been applied to a set of artificially generated images, in which the effects of non‐homogeneous specimen thickness and noise were incorporated. The simulation experiments indicate that the results may be used for both qualitative (element distribution) and quantitative (element concentration) purposes.