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Investigation and use of plasmon losses in energy‐filtering transmission electron microscopy
Author(s) -
Fromm I.,
Reimer L.,
Rennekamp R.
Publication year - 1992
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1992.tb01526.x
Subject(s) - plasmon , electron energy loss spectroscopy , transmission electron microscopy , materials science , optics , surface plasmon , electron , spectroscopy , dispersion (optics) , molecular physics , diffraction , scattering , electron microscope , chemistry , optoelectronics , physics , quantum mechanics
SUMMARY The electron spectroscopic imaging (ESI), diffraction (ESD) and different types of electron energy‐loss spectroscopy (EELS) modes in an energy‐filtering transmission electron microscope can all be used for the investigation and analytical use of plasmon losses. Shifts of plasmon losses caused by differences in composition can be detected with an accuracy of 0.1 eV by parallel‐recorded EELS (PEELS). The dispersion of plasmon losses and the cut‐off angle θ c can be observed by angle‐dispersive EELS and by recording spectra at different scattering angles θ. ESD patterns with a selected energy window width of 1 eV enable the dispersion and its anisotropy to be imaged by characteristic intensity distributions between the primary beam and the first Bragg diffracted beams. The ESI mode can be used for the selective imaging of precipitates and for the investigation of the excitation volume of plasmons in small particles.