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Distribution of projection angles for single‐axis‐tilt electron microscope tomography of extended thin planar specimens
Author(s) -
Levy Henri A.,
Olins Ada L.,
Olins Donald E.
Publication year - 1992
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1992.tb01490.x
Subject(s) - tilt (camera) , planar , electron tomography , tomography , optics , projection (relational algebra) , electron microscope , electron , materials science , planar projection , physics , geometry , scanning transmission electron microscopy , computer science , orthographic projection , mathematics , computer graphics (images) , algorithm , quantum mechanics
SUMMARY An optimized distribution of tilt angles for tomography of specimens of non‐circular cross‐section is derived and tested with reconstructions of a phantom model.