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Axial resolution of confocal microscopes with parallel‐beam detection
Author(s) -
Shao Zhifeng,
Baumann Otto,
Somlyo Andrew P.
Publication year - 1991
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1991.tb03187.x
Subject(s) - confocal , microscope , 4pi microscope , optics , resolution (logic) , confocal microscopy , materials science , high resolution , beam (structure) , microscopy , conventional transmission electron microscope , physics , electron microscope , computer science , scanning transmission electron microscopy , artificial intelligence , remote sensing , geology
SUMMARY We present a simple theory for the evaluation of the axial resolution of a confocal scanning microscope with parallel‐beam detection. The results demonstrate that, in certain cases, the collection efficiency is low compared with a conventional confocal microscope, but the axial resolution may be further improved.