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A confocal beam scanning white‐light microscope
Author(s) -
Hell S.,
Witting S.,
Schickfus M.,
Resandt R. W. Wijnaendts,
Hunklinger S.,
Smolka E.,
Neiger M.
Publication year - 1991
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1991.tb03170.x
Subject(s) - microscope , 4pi microscope , optics , confocal , materials science , optical microscope , scanning electron microscope , confocal laser scanning microscope , conventional transmission electron microscope , resolution (logic) , microscopy , scanning transmission electron microscopy , physics , artificial intelligence , computer science
SUMMARY We report on a confocal beam scanning microscope utilizing a continuous Xe short‐arc lamp operating in the visible spectrum with unprecedented radiance. Measurements of lateral and vertical resolution will be presented and compared with those of an equivalent scanning laser microscope. Resolution of the white‐light microscope is equivalent to that of the scanning laser microscope. White‐light microscope images positively stand out from those of the scanning laser microscope by their lack of artefacts caused by interference.