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The characterization of microstructures in the atom probe
Author(s) -
Hetherington M. G.,
Miller M. K.
Publication year - 1991
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1991.tb03105.x
Subject(s) - microstructure , characterization (materials science) , atom probe , atom (system on chip) , bernoulli trial , sequence (biology) , ion , statistical physics , bernoulli's principle , markov chain , materials science , scale (ratio) , nanotechnology , computer science , physics , chemistry , mathematics , thermodynamics , quantum mechanics , combinatorics , machine learning , metallurgy , biochemistry , embedded system
SUMMARY The atom probe can be used to characterize fine‐scale microstructures. The results presented in this and a subsequent paper attempt to develop a methodology for interpreting information concerning 3‐D structures from the sequence of ions detected in the atom probe. Probability theory (Bernoulli trials and Markov processes) is used to build appropriate mathematical descriptions of different types of microstructure.