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Early results using high‐resolution, low‐voltage, low‐temperature SEM
Author(s) -
Pawley James B.,
Walther Paul,
Shih ShianJiun,
Malecki Marek
Publication year - 1991
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1991.tb03093.x
Subject(s) - low voltage , materials science , low resolution , voltage , resolution (logic) , high resolution , optoelectronics , computer science , remote sensing , electrical engineering , geology , artificial intelligence , engineering
SUMMARY Recent advances in the design of the scanning electron microscope (SEM) column, such as the coupling of a field‐emission gun to a low‐aberration immersion lens and the availability of a high‐stability cryo‐transfer stage, make low‐temperature, low‐voltage SEM (LTLVSEM) possible at very high resolution. We have used this combination to obtain results with uncoated biological specimens. The trichocyst from a Paramecium was used as a test specimen to observe the shrinkage of this structure as the temperature is raised from 170 K to room temperature following freeze‐drying. High‐magnification stereo images were obtained of trichocysts that had been prepared by freezing, freeze‐substitution and critical‐point drying and which were subsequently viewed by LTLVSEM to reduce beam damage and contamination.