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Relocation of minute specimens for scanning electron microscopy
Author(s) -
Dvorachek M.,
Rosenfeld A.
Publication year - 1990
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1990.tb04777.x
Subject(s) - scanning electron microscope , relocation , stub (electronics) , materials science , position (finance) , electron microscope , microscopy , optics , computer graphics (images) , computer science , crystallography , chemistry , physics , engineering , composite material , business , structural engineering , programming language , finance
SUMMARY A relocatable stub‐holder assembly for SEM that can record the position of small specimens by x‐y‐coordinates is described. It enables the accurate pin‐pointing of objects for further study later.