Low‐temperature EDX microanalysis of halogenated copper phthalocyanine samples | Zendy

McColgan P. | Zendy; Chapman J. N. | Zendy; Nicholson W. A. P. | Zendy

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Low‐temperature EDX microanalysis of halogenated copper phthalocyanine samples

Author(s) -

McColgan P.,

Chapman J. N.,

Nicholson W. A. P.

Publication year - 1990

Publication title -

journal of microscopy

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.569

H-Index - 111

eISSN - 1365-2818

pISSN - 0022-2720

DOI - 10.1111/j.1365-2818.1990.tb03066.x

Subject(s) - microanalysis , copper phthalocyanine , copper , liquid nitrogen , halogen , analytical chemistry (journal) , chemistry , nitrogen , phthalocyanine , pigment , halogen lamp , materials science , environmental chemistry , optics , organic chemistry , optoelectronics , alkyl , physics

SUMMARY X‐ray microanalysis at temperatures near that of liquid nitrogen is used to determine the halogen content of small volumes of halogenated copper phthalocyanine pigments. Details of the low‐temperature stage used and the benefits conferred by cooling the sample are given. The experimental procedure adopted involved recording a series of spectra from the same area and extrapolating the measured compositions to zero dose. Factors affecting the accuracy of the analyses are discussed.

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