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EELS quantification of the elements Ba to Tm by means of N 45 edges
Author(s) -
Hofer Ferdinand
Publication year - 1989
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1989.tb02929.x
Subject(s) - atomic number , electron energy loss spectroscopy , cross section (physics) , scattering , spectral line , analytical chemistry (journal) , energy (signal processing) , chemistry , atomic physics , electron , materials science , physics , optics , nuclear physics , quantum mechanics , astronomy , chromatography
SUMMARY The quantification of electron energy‐loss spectra requires determination of the partial scattering cross‐sections. For N 45 edges these data are unknown. Therefore, we have determined a set of cross‐section ratios (k‐factors) of N 45 and oxygen K energy‐loss edges for a number of elements between the atomic numbers 56 and 70 using thin‐film standards (oxide compounds), which will enable quantification of these rare earth elements.

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