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Scanning tunnelling microscopy measurements of carbon deposited on to graphite
Author(s) -
Nakagiri Nobuyuki,
Kaizuka Hiroshi
Publication year - 1989
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1989.tb02927.x
Subject(s) - hillock , graphite , deposition (geology) , surface finish , materials science , scanning tunneling microscope , carbon fibers , surface roughness , analytical chemistry (journal) , microscopy , spectral line , optics , chemistry , nanotechnology , composite material , geology , physics , chromatography , astronomy , sediment , composite number , paleontology
SUMMARY Topographic STM images were taken of carbon deposited onto cleaved Kishgraphite. Hillocks were seen at places in the STM images for 1‐ and 2‐nm depositions. The hillocks covered the entire surface with depositions in the range 3–8 nm and the r.m.s. roughness did not change with deposition in this region. The Fourier spectra for 3–8‐nm depositions show peaks at around 5 and 8 nm. The peak‐to‐valley distance was proportional to roughness with a coefficient of 7.8.