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A new rapid method of air‐drying for scanning electron microscopy using tetramethylsilane
Author(s) -
Dey Sudip,
Baul T. S. Basu,
Roy B.,
Dey D.
Publication year - 1989
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1989.tb02925.x
Subject(s) - tetramethylsilane , scanning electron microscope , materials science , electron microscope , microscopy , chromatography , analytical chemistry (journal) , chemistry , nanotechnology , optics , composite material , physics , organic chemistry
SUMMARY A new rapid air‐drying technique which gives results comparable to critical point‐drying is described for scanning electron microscopy, using a trematode parasite, Homalogaster paloniae , as a test specimen.