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An X‐ray projection microscope with field emission gun
Author(s) -
Kolařík V.,
Svoboda V.
Publication year - 1989
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1989.tb02923.x
Subject(s) - microscope , tungsten , optics , projection (relational algebra) , materials science , lens (geology) , x ray , field ion microscope , field emission gun , microscopy , field electron emission , physics , scanning electron microscope , computer science , metallurgy , ion , algorithm , quantum mechanics , electron
SUMMARY The application of a field emission gun in an X‐ray projection microscope is described. In the microscope, a tungsten cathode activated by zirconium and oxygen in combination with the magnetic one‐lens imaging system was used. In order to obtain a sufficiently small‐sized X‐ray source, a Cu‐Be‐Al sandwich target was applied.