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Contrast in the electron spectroscopic imaging mode of a TEM. I. Influence of zero‐loss filtering on scattering contrast
Author(s) -
Reimer L.,
RossMessemer M.
Publication year - 1989
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1989.tb02880.x
Subject(s) - optics , contrast (vision) , scattering , materials science , transmission electron microscopy , contrast transfer function , electron , aperture (computer memory) , zero (linguistics) , transmission (telecommunications) , electron microscope , chromatic scale , spherical aberration , physics , molecular physics , lens (geology) , quantum mechanics , computer science , telecommunications , linguistics , philosophy , acoustics
SUMMARY Measured values of the transmission of amorphous films as a function of the objective aperture and film thickness can be described by a single‐scattering theory for unfiltered and zero‐loss filtered images in the electron spectroscopic imaging mode of a transmission electron microscope. The theory can be applied to estimate the gain of contrast by zero‐loss filtering for specimen structures larger and smaller than the chromatic aberration disc.