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Three‐dimensional X‐ray microscopy with accurate registration of tomographic sections
Author(s) -
Dover S. D.,
Elliott J. C.,
Boakes R.,
Bowen D. K.
Publication year - 1989
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1989.tb00559.x
Subject(s) - tomographic reconstruction , tomography , resolution (logic) , microscopy , rotation (mathematics) , position (finance) , x ray , materials science , optics , physics , geometry , mathematics , computer science , artificial intelligence , finance , economics
SUMMARY X‐ray microtomography has been used to study the internal flaws and external shape of a 0.75 × 1 mm copper sulphate crystal at a resolution of 25 μm. The problems of accurate tomographic reconstruction and the subsequent registration of the reconstructed sections to give a complete 3‐D image are considered when the position of the axis of rotation of the specimen varies slightly between projections.