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Quantitative high resolution transmission electron microscopy: the need for energy filtering and the advantages of energy‐loss imaging
Author(s) -
Stobbs W. M.,
Saxton W. O.
Publication year - 1988
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1988.tb04623.x
Subject(s) - resolution (logic) , electron microscope , electron , energy (signal processing) , scanning transmission electron microscopy , image resolution , optics , transmission electron microscopy , materials science , microscopy , energy filtered transmission electron microscopy , physics , microscope , high resolution transmission electron microscopy , high resolution , computer science , nuclear physics , artificial intelligence , remote sensing , geology , quantum mechanics
SUMMARY Evidence is presented that inelastically scattered electrons contribute significant detail at the atomic level to high resolution images, particularly in high voltage instruments. The implications for quantitative image interpretation are shown to be serious and a case is made for incorporating facilities for energy‐filtered imaging in future high resolution electron microscopes.