Premium
High resolution electron microscope observations of microstructures in A15 type Nb 3 X superconductors
Author(s) -
Takeda M.,
Yoshida H.,
Endoh H.,
Hashimoto H.
Publication year - 1988
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1988.tb04621.x
Subject(s) - electron microscope , superconductivity , microstructure , materials science , resolution (logic) , ion , electron , image contrast , crystal structure , crystallography , irradiation , annealing (glass) , scanning electron microscope , optics , condensed matter physics , chemistry , physics , metallurgy , artificial intelligence , computer science , nuclear physics , composite material , organic chemistry , quantum mechanics
SUMMARY Microstructures of superconducting Nb 3 X(A15) compounds are studied by means of high resolution electron microscopy. Structure images are obtained with the 400kV high resolution electron microscope for both the annealed and ion‐irradiated crystals. The images obtained from the annealed crystals show bright contrast patterns similar to the projections of Nb and X atoms comprising the A15 structure. Defects observed in the annealed crystal irradiated with 40 kV Nb + ions show characteristic features in contrast. The dependence of image contrast on the element X and the atomic structures of the defects are discussed by comparison with the calculated images.