Premium
Scanning tunnelling and atomic force microscopy performed with the same probe in one unit
Author(s) -
Bryant P. J.,
Miller R. G.,
Deeken R.,
Yang R.,
Zheng Y. C.
Publication year - 1988
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1988.tb01460.x
Subject(s) - lever , conductive atomic force microscopy , graphite , materials science , scanning tunneling microscope , scanning probe microscopy , tungsten , quantum tunnelling , microscopy , atomic force microscopy , scanning capacitance microscopy , electrostatic force microscope , nanotechnology , atomic force acoustic microscopy , kelvin probe force microscope , current (fluid) , optics , magnetic force microscope , optoelectronics , composite material , physics , metallurgy , scanning confocal electron microscopy , magnetization , quantum mechanics , magnetic field , thermodynamics
SUMMARY The technique demonstrated here provides features of both scanning tunnelling microscopy (STM) and atomic force microscopy (AFM). The metallic probe acts to record current variations and sense forces from the same sample area simultaneously. Thus, separate images may be recorded, in registry. The collected data allows real space correlations between some electrical properties and the geometric structure of a sample surface. The same tip is used since the geometry and condition of the tip can effect the data recordings. Platinum alloys, tungsten and graphite tips have been employed successfully. An AFM lever can respond to surface contact forces, within the elastic limits of the sample, while electric current is sensed by the tip of the lever. The usefulness of this experimental procedure is tested here by an application to semiconducting samples of Ag‐doped CdTe in air and in paraffin oil media.