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Scanning near‐field optical microscopy (SNOM)
Author(s) -
Pohl D. W.,
Fischer U. Ch.,
Dürig U. T.
Publication year - 1988
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1988.tb01458.x
Subject(s) - near field scanning optical microscope , optics , optical microscope , microscopy , materials science , stylus , diffraction , near and far field , physics , scanning electron microscope , acoustics
SUMMARY SNOM is a non‐contact stylus microscopy analogous to STM. Optical near‐field interaction is used to sense approach and optical properties on the nanometre scale (≅1 nm normal, 20–50 nm lateral). SNOM was demonstrated in transmission and reflection, in a topographic mode, and with amplitude as well as phase objects. The excitation of plasmons in the SNOM ‘tip’, a very recent development, greatly enhances sensitivity and permits intriguing new optical experiments. Overcoming the limit of diffraction, SNOM turns a long‐held dream of optical microscopists into reality.