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Fine structure in field emission resonances at surfaces
Author(s) -
Coombs J. H.,
Gimzewski J. K.
Publication year - 1988
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1988.tb01457.x
Subject(s) - amplitude , resonance (particle physics) , quantum tunnelling , interference (communication) , field (mathematics) , atomic physics , physics , field electron emission , electron , molecular physics , optics , condensed matter physics , quantum mechanics , channel (broadcasting) , electrical engineering , mathematics , engineering , pure mathematics
SUMMARY We have measured field‐emission resonances (FER) to much higher quantum states than previously observed enabling fine structure in the resonance amplitudes to be investigated. We show that this electron wave interference effect carries additional information in the resonance amplitudes and energies and is sensitive to lateral tip position in a scanning tunnelling microscope experiment. We propose a new method of data analysis that can distinguish between some of the possible origins of the fine structure.