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A scanning tunnelling microscope for operation in air
Author(s) -
Yao I. E.,
Shang G. Y.,
Jiao Y. K.,
Yi Y.,
Bai C. L.,
He J.,
Zhong J. C.,
Rong D. N.
Publication year - 1988
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1988.tb01436.x
Subject(s) - scanner , brightness , microscope , optics , modulation (music) , quantum tunnelling , vibration isolation , materials science , amplitude , vibration , optoelectronics , physics , acoustics
SUMMARY In this paper a scanning tunnelling microscope for operation in air is described with emphasis on the coarse and fine sample positioning mechanism, piezoelectric scanner and vibration isolation. Line scan (amplitude modulation), top view (brightness modulation) and combined shaded topographical images of the surface of highly orientated pyrolitic graphite are shown.

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