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The STM system constructed for analytical application
Author(s) -
Okumura Akihiko,
Miyamura Kazuo,
Gohshi Yohichi
Publication year - 1988
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1988.tb01431.x
Subject(s) - graphite , sample (material) , materials science , carbon fibers , noise (video) , surface (topology) , analytical chemistry (journal) , nanotechnology , physics , computer science , chemistry , metallurgy , composite material , mathematics , geometry , environmental chemistry , artificial intelligence , image (mathematics) , thermodynamics , composite number
SUMMARY An STM equipment capable of measuring I‐V characteristics of a sample surface has been constructed, and some preliminary measurements have been made. Carbon atoms in graphite were resolved. Reproducible and low noise I‐V characteristics were obtained, which allowed to observe d I /d V and d 2 I/d V 2 .