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Differential scanning tunnelling microscopy
Author(s) -
Abraham David W.,
Williams C. C.,
Wickramasinghe H. K.
Publication year - 1988
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1988.tb01426.x
Subject(s) - differential (mechanical device) , scanning tunneling microscope , microscopy , quantum tunnelling , dither , optics , noise (video) , materials science , physics , image (mathematics) , chemistry , nanotechnology , optoelectronics , computer science , computer vision , noise shaping , thermodynamics
SUMMARY We review the principle of differential imaging and its application to scanning tunnelling microscopy (STM). It is shown that placing a lateral dither on an STM tip at high frequency provides the means for transfering topographic information to a frequency range where noise is small. Differential STM imaging on graphite and gold is demonstrated. A simple relation between the differential image and the conventional topographic image is described.