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A frictional force microscope controlled with an electromagnet
Author(s) -
Kaneko R.
Publication year - 1988
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1988.tb01397.x
Subject(s) - mechanics , spring (device) , electromagnet , materials science , microscope , radius , displacement (psychology) , magnet , magnetic force microscope , slip (aerodynamics) , electromagnetic suspension , optics , physics , magnetic field , magnetization , psychology , computer security , quantum mechanics , computer science , psychotherapist , thermodynamics
SUMMARY Frictional forces are usually measured by detecting spring displacement. To obtain high‐resolution measurements of frictional force distributions, a sharp tip and a light load are required. In measuring frictional force on relatively rough surfaces, using very sharp tips (submicron radii), significant stick‐slip motions are observed, and continuously varying dynamic frictional forces can not be measured. To measure continuous friction distributions between sharp tips and surfaces with light loads, a new frictional force microscope (FFM) is developed. This FFM has an electromagnet to maintain the tip suspension spring in a non‐deflected position. The frictional force is then measured from the magnet current. Using this FFM, continuous friction distributions between 0·1 μm radius diamond tips and magnetic disk surfaces with light loads (less than 10 μN) are obtained.