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The STM learning curve and where it may take us *
Author(s) -
Demuth J. E.,
Koehler U.,
Hamers R. J.
Publication year - 1988
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1988.tb01391.x
Subject(s) - scanning tunneling microscope , resolution (logic) , high resolution , spectroscopy , quantum tunnelling , materials science , nanotechnology , chemistry , chemical physics , physics , computer science , optoelectronics , artificial intelligence , remote sensing , geology , quantum mechanics
SUMMARY The scanning tunnelling microscope (STM) has proved to be an extraordinary method to investigate surfaces in vacuum, air and liquid environments. Several issues regarding the use of the STM for atomic resolution studies are discussed. These include electronic contributions to STM images, the role of the tip in resolution and spectroscopy, as well as the need for complementary information about chemical composition or sub‐surface structure.