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STM study of silver intercalation into 2H‐NbSe 2 crystals
Author(s) -
Watanabe M.,
Dahn D. C.,
Blackford B.,
Jericho M. H.
Publication year - 1988
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1988.tb01376.x
Subject(s) - intercalation (chemistry) , scanning tunneling microscope , electrochemistry , materials science , ion , crystallography , quantum tunnelling , lattice (music) , high resolution , chemistry , nanotechnology , mineralogy , optoelectronics , inorganic chemistry , geology , electrode , physics , organic chemistry , acoustics , remote sensing
SUMMARY We have made scanning tunnelling microscope (STM) studies of the lattice expansion and topography of cleaved crystals of 2H‐NbSe 2 which were intercalated in situ with silver ions entering along one edge of the samples. The measurements confirm the high surface mobility of silver seen in earlier electrochemical studies. The expansion measurements made with optimum 2 Å resolution showed no convincing evidence of silver staging domains. Topographic images revealed noisy patches and shallow depressions on cleaved surfaces of intercalated samples. It is suggested that these depressions might represent silver‐poor regions in the first intercalation layer.