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High spatial resolution secondary ion imaging and secondary ion mass spectrometry of aluminium‐lithium alloys
Author(s) -
Williams D. B.,
LeviSetti R.,
Chabala J. M.,
Newbury D. E.
Publication year - 1987
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1987.tb02870.x
Subject(s) - secondary ion mass spectrometry , lithium (medication) , microanalysis , ion , aluminium , mass spectrometry , resolution (logic) , analytical chemistry (journal) , chemistry , materials science , chromatography , metallurgy , medicine , organic chemistry , artificial intelligence , computer science , endocrinology
SUMMARY Samples of aluminium‐lithium alloys have been observed by scanning ion microscopy and analysed by secondary ion mass spectrometry. The high signal‐to‐noise ratio of the positive secondary lithium ion opens up the possibility of both high resolution imaging and microanalysis of lithium distributions in aluminium and other materials. Some of the problems encountered due to sample preparation are discussed and ion images of both the artefacts and the true lithium distribution are shown.