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Mass loss rate in collodion is greatly reduced at liquid helium temperature
Author(s) -
Lamvik M. K.,
Kopf D. A.,
Davilla S. D.
Publication year - 1987
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1987.tb02867.x
Subject(s) - collodion , liquid nitrogen , liquid helium , helium , materials science , scanning electron microscope , nitrogen , analytical chemistry (journal) , chemistry , composite material , chromatography , biochemistry , organic chemistry , membrane
SUMMARY The mass thickness of collodion films has been monitored at several temperatures, under conditions typical of electron microscopy, through the use of an electron energy loss spectrometer. Compared to room temperature, only a five‐fold reduction in the rate of mass loss was observed through the use of a commercial liquid nitrogen cooled stage; in contrast, the rate of mass loss was reduced more than one hundred fold when these films were held at liquid helium temperature.