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Laser scanning microscope: Differential phase images
Author(s) -
Horikawa Yoshiaki,
Yamamoto Mitsunori,
Dosaka Shinichi
Publication year - 1987
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1987.tb02850.x
Subject(s) - optics , materials science , microscope , optical microscope , differential interference contrast microscopy , laser , deflection (physics) , microscopy , phase contrast microscopy , detector , laser beams , optical sectioning , physics , scanning electron microscope
SUMMARY A beam‐deflection type laser scanning microscope for differential phase contrast images using the split‐detector technique is developed and the images are obtained in real time (30 images/s). The special optical design allows transfer of the pupil information necessary to the imaging of the differential phase contrast images during beam deflection and the use of acousto‐optic deflectors with the associated correction system enables real time imaging. Differential phase images of surface details of crystals are simply obtained without silver coating or etching, which are indispensable in a normal DIC. Biological specimens are also observed.