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An evaluation, by Fourier analysis, of some of the errors introduced in reflectance measurements
Author(s) -
Marcos C.,
Virgos J. M.,
Nicieza C. G.
Publication year - 1987
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1987.tb01337.x
Subject(s) - optics , fourier transform , orthogonality , fourier analysis , fourier series , reflectivity , rotation (mathematics) , mathematics , physics , mathematical analysis , geometry
SUMMARY In order to evaluate the errors which can be introduced in the measurement of reflectance, we have made a study of data obtained for several minerals and in two immersion media on turning the microscope stage to a succession of positions relatively orientated by 45°. Fourier analysis of the results allows an estimate of the different errors as a function of the periodicity with which they appear on a full rotation of the stage. The mean magnitude of two of the Fourier coefficients is shown to provide a measure of the quality of the measurements further allowing evaluation of the equipment used, the orthogonality of the sample in relation to the incident light, and other errors of different periodicity.