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A simple method for quantitative SEM at low magnifications
Author(s) -
Waitz W.,
Ennemoser O.
Publication year - 1987
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1987.tb01330.x
Subject(s) - magnification , scanning electron microscope , helix pomatia , simple (philosophy) , range (aeronautics) , materials science , optics , biological specimen , physics , composite material , geology , paleontology , philosophy , epistemology , snail
SUMMARY A method for quantitative scanning electron microscopy (SEM) at low magnifications has been developed. Quantitative measurements in SEM are rare and often not accurate, because of a systematical error, i.e. a nominal magnification exists only in one direction of the photograph. Our method is suitable for smooth surfaces as it proves the changes of magnification within the two‐dimensional range. In a first step EM‐grids are used as samples. In a second step it is shown how the method can be applied to biological specimens. We took the microstructure of Helix pomatia shells as example.