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Quantitative microlocalization of diffusible ions in normal and galactose cataractous rat lens by secondary ion mass spectrometry
Author(s) -
Burns Margaret S.,
File David M.
Publication year - 1986
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1986.tb02797.x
Subject(s) - mass spectrometry , ion , chemistry , secondary ion mass spectrometry , quantitative analysis (chemistry) , epoxy , analytical chemistry (journal) , materials science , chromatography , organic chemistry
SUMMARY Secondary ion mass spectrometry (SIMS) is a surface analytical technique with high sensitivity for elemental detection and microlocalization capabilities within the micrometre range. Quantitative analysis of epoxy resins and gelatin have been reported (Burns‐Bellhorn & File, 1979).