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Observation of lattice fringes of the Si(111)–7×7 structure by reflection electron microscopy *
Author(s) -
Tanishiro Y.,
Takayanagi K.,
Yagi K.
Publication year - 1986
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1986.tb02758.x
Subject(s) - optics , reflection (computer programming) , lattice (music) , materials science , electron microscope , microscopy , surface structure , crystal structure , electron diffraction , zone axis , molecular physics , physics , diffraction , crystallography , chemistry , computer science , acoustics , programming language
SUMMARY Lattice fringes of Si(111)–7×7 reconstructed surface structure in reflection electron microscopy (REM) are observed for the first time, and their characteristic features are presented. Due to a glancing reflection condition in REM, the fringes with a spacing of 2.3 nm of the 7×7 surface structure lattice are seen in a region of a certain defocus range (about 6–8 μm) in a foreshortened image. The glancing reflection geometry also results in a complicated dependence of fringe directions on imaging conditions (beam alignment, crystal orientation). A shift of the fringes across the surface atomic steps and out of phase boundaries is observed.