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Comparison of the Diffraction Contrast and the Slice Method for Image Computation
Author(s) -
Howie A.,
Hutchison J. L.
Publication year - 1986
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1986.tb02750.x
Subject(s) - contrast (vision) , diffraction , stacking , image contrast , scattering , computation , image (mathematics) , boundary (topology) , high contrast , optics , physics , materials science , computer science , algorithm , mathematics , artificial intelligence , nuclear magnetic resonance , mathematical analysis
SUMMARY The relation between the diffraction contrast theory and the slice method for image contrast calculations is discussed with specific reference to small voids, twin boundary images and weak beam images of stacking faults. The difference between the deformable ion and the rigid ion model for the scattering potential is explored.