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Electronic image formation in high‐voltage TEM by sequential pixel acquisition
Author(s) -
Fotino Mircea
Publication year - 1986
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1986.tb02718.x
Subject(s) - pixel , optics , raster graphics , diffraction , detector , raster scan , materials science , displacement (psychology) , physics , energy (signal processing) , prism , computer science , artificial intelligence , psychology , quantum mechanics , psychotherapist
SUMMARY We describe a complete hybrid imaging system for the electronic detection and manipulation of high‐voltage TEM images. The system includes a recently incorporated two‐dimensional beam deflector for dissecting the image into pixels by displacing it in a raster in front of an aperture leading to an electron detector. The characteristics of images thus formed by sequential pixel acquisition and displayed on a CRT are discussed and illustrated. Absorption or thickness profiles are also obtained by displaying the scanned pixel intensity in Y‐modulation. Similarly, the displacement of an entire diffraction pattern allows the intensities of individual diffraction spots to be quantitated directly over a wide dynamic range. The direct splitting of the image into electronically controlled pixels can be applied to local mass measurements and to energy‐loss analysis by means of a simple magnetic prism that can also provide energy filtering in lieu of a more elaborate electron‐optical, image‐preserving system.