Premium
Specimen preparation methods for the examination of surfaces and interfaces in the transmission electron microscope
Author(s) -
Newcomb S. B.,
Boothroyd C. B.,
Stobbs W. M.
Publication year - 1985
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1985.tb02675.x
Subject(s) - transmission electron microscopy , reliability (semiconductor) , interface (matter) , transmission (telecommunications) , materials science , computer science , electron microscope , differential (mechanical device) , nanotechnology , optics , physics , composite material , telecommunications , thermodynamics , power (physics) , capillary number , capillary action , quantum mechanics
SUMMARY Various techniques for the preparation of cross‐sectional and plan view TEM specimens of surfaces and interfaces are described. Particular emphasis is given to preparative methods which are both generally applicable and which minimize differential thinning of the materials present on either side of the interface of interest, thereby improving the reliability of the approach.