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HIGH RESOLUTION MAGNETIC MICROSTRUCTURE IMAGING USING SECONDARY ELECTRON SPIN POLARIZATION ANALYSIS IN A SCANNING ELECTRON MICROSCOPE
Author(s) -
Unguris J.,
Hembree G. G.,
Celotta R. J.,
Pierce D. T.
Publication year - 1985
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1985.tb02628.x
Subject(s) - high resolution , library science , national laboratory , physics , engineering physics , computer science , history , archaeology