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Progress in multilayer devices as X‐ray optical elements
Author(s) -
Dhez P.
Publication year - 1985
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1985.tb02620.x
Subject(s) - reflectivity , optics , range (aeronautics) , materials science , optoelectronics , computer science , physics , composite material
SUMMARY A new kind of mirror based on multilayering techniques gives the possibility of preparing artificial Bragg reflectors over all the X‐UV range. The possibility to choose most of the parameters governing the reflectivity opens the possibility to get a very good efficiency, even under normal incidence. Main parameters, evaporating techniques and tests are described. Some example of recent results are compared to the theoretical predictions.