Premium
Comments on the computation of electron wave‐propagation in the slice methods
Author(s) -
Ishikuza K.
Publication year - 1985
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1985.tb02581.x
Subject(s) - computation , fast fourier transform , convolution (computer science) , wafer , diffraction , electron , computer science , computational physics , wave propagation , overlap–add method , physics , optics , algorithm , fourier transform , artificial intelligence , quantum mechanics , fourier analysis , optoelectronics , artificial neural network , fractional fourier transform
SUMMARY The slice methods developed to calculate dynamical electron diffraction involve an interaction of electrons with each slice and the wave‐propagation between the successive slices alternately. Thus an accurate evaluation of the propagation effect, which is mathematically described in terms of a convolution integral, is indispensable. Three main slice methods are examined from the viewpoint of their accuracy and efficiency on the numerical evaluation of the wave‐propagation. Some difficulties of two real‐space methods are discussed. In conclusion, the FFT multisclie method is the fastest way to obtain the most accurate evaluation of the wave‐propagation at present.