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Systematic inquiry in tests of negative/positive replica combinations for SEM
Author(s) -
Bromage Timothy G.
Publication year - 1985
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1985.tb02578.x
Subject(s) - replica , silicone , scanning electron microscope , impression , epoxy , resolution (logic) , replica trick , materials science , computer science , composite material , artificial intelligence , world wide web , visual arts , art
SUMMARY High resolution replica materials are routinely used in scanning electron microscopy. A systematic evaluating procedure for replica combinations is proposed which details fourteen points to be recorded. These points include quantitative and qualitative information useful when assessing a replica combination for a particular research problem. A case study employing one silicone‐based impression material and one epoxy resin is performed as an example of the procedure.