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Electron microscope study of surface topography by geometrical determination of metric characteristics of surface elements
Author(s) -
Simov S.,
Simova E.,
Davidkov B.
Publication year - 1985
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1985.tb02560.x
Subject(s) - plane (geometry) , surface (topology) , geometry , point (geometry) , line (geometry) , coordinate system , curvilinear coordinates , bipolar coordinates , metric (unit) , spherical coordinate system , computation , tetrahedron , orthogonal coordinates , cylindrical coordinate system , log polar coordinates , physics , mathematics , optics , algorithm , engineering , operations management
SUMMARY Three micrographs made at different tilting angles are necessary to determine the spatial coordinates of each point from the surface of micro‐object. The x′ and y′ coordinates of the points are measured in an arbitrary coordinate system O'X′Y′ which ensures convenience in measurements. The coordinates measured are transformed into a main coordinate system OXYZ related to the microscope and the image plane. The z coordinates are calculated. The coordinates of the points are used to solve the following metric problems by applying analytical geometry: computation of (1) distances (between: two points, a point and a straight line, a point and a plane), (2) angles (between: two straight lines, a straight line and a plane, two planes), (3) area of a triangle and (4) volume of a body, which may devided into tetrahedra. A computer program for solving the above problems is written in BASIC.